EPR identification of a trigonal FeIn defect in silicon
- 31 May 1989
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 70 (8) , 807-810
- https://doi.org/10.1016/0038-1098(89)90503-6
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Metastable-defect behavior in silicon: Charge-state-controlled reorientation of iron-aluminum pairsPhysical Review B, 1985
- Electron paramagnetic resonance on iron-acceptor pairs in siliconPhysical Review B, 1984
- Electron Spin Resonance in SemiconductorsPublished by Elsevier ,1962