Correlation-Based Data Processing for an Inductively Coupled Plasma/Fourier Transform Spectrometer System

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Abstract
A simple cross-correlation technique is presented for processing interferograms generated by an ultraviolet-visible Fourier transform spectrometer coupled to an inductively coupled plasma. Interferograms resulting from the emission of samples in the ICP can be automatically interrogated for the presence or absence of up to 70 elements, and automatic qualitative analysis is possible, complete with an assessment of spectral overlaps. In concept, the cross-correlation method amounts to “software slew-scanning” as it provides one with an a posteriori method to study and select the spectral information about the sample as measured with the FTS-ICP system. This represents a unique spectrochemical measurement capability compared with current dispersive-based, direct-reading, and slew-scanning spectrometers as applied to ICP emission spectrometry.