Modeling ion bombardment induced submicron-scale surface roughening
- 1 October 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 103 (2) , 156-160
- https://doi.org/10.1016/0168-583x(95)00833-0
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfacesPhysical Review Letters, 1993
- A note on low energy recoils in collisional mixingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- Universality in surface growth: Scaling functions and amplitude ratiosPhysical Review A, 1992
- Submicron-scale surface roughening induced by ion bombardmentPhysical Review Letters, 1991
- Calculation of collisional mixingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Numerical solution of a continuum equation for interface growth in 2+1 dimensionsPhysical Review A, 1990
- Theoretical aspects of atomic mixing by ion beamsNuclear Instruments and Methods, 1981