Applications of the near-edge and low-loss fine structure in the analysis of diamond
- 1 April 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 28 (1-4) , 43-46
- https://doi.org/10.1016/0304-3991(89)90267-2
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- EELS analysis of vacuum arc-deposited diamond-like filmsPhilosophical Magazine Letters, 1988
- On voidites: a high-resolution transmission electron microscopic study of faceted void-like defects in natural diamondsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1987
- K-shell excitation spectra of CO, N2 and O2Journal of Electron Spectroscopy and Related Phenomena, 1980