Determination of atomic profiles by Fourier analysis and deconvolution of Fabry-Perot interferograms. Comparison of two methods of interferogram processing
- 1 January 1980
- journal article
- Published by IOP Publishing in Journal of Optics
- Vol. 11 (1) , 57-64
- https://doi.org/10.1088/0150-536x/11/1/004
Abstract
To analyse Fabry-Perot interferograms, and to determine source profiles, two distinct methods of calculation by deconvolution were used. The first processing was based on the works of Duffieux (1939) and used Fourier analysis. Source functions and instrumental broadening functions were developed in Fourier's series and this method allowed the attainment of the source profile in its totality, if its function support was of finite value.Keywords
This publication has 11 references indexed in Scilit:
- Analytical Description of a Fabry-Perot Spectrometer 3: Off-Axis Behavior and Interference FiltersApplied Optics, 1974
- Analysis of Fabry-Perot Interferograms by Means of Their Fourier TransformsApplied Optics, 1971
- A Technique for Recovering Doppler Line Profiles from Fabry-Perot Interferometer Fringes of Very Low IntensityApplied Optics, 1971
- The problem of error in deconvolutionJournal of Physics A: General Physics, 1970
- Analytical Description of a Fabry-Perot Photoelectric Spectrometer 2: Numerical ResultsApplied Optics, 1970
- A scanning Fabry-Perot interferometer for plasma diagnosticsJournal of Physics E: Scientific Instruments, 1970
- Calcul Numérique du Produit de Convolution de Deux Fonctions Dont la Transformés de Fourier Est à Support BornéOptica Acta: International Journal of Optics, 1969
- Propagation of some systematic errors in X-ray line profile analysisActa Crystallographica, 1967
- Analytical Description of a Fabry–Perot Photoelectric SpectrometerApplied Optics, 1966
- Über die Intensitätsverteilung von Spektrallinien im Pérot‐Fabry‐InterferometerAnnalen der Physik, 1953