Synchrotron X-ray fractography: A novel technique for fracture-surface analysis
- 31 July 1983
- journal article
- Published by Elsevier in Materials Letters
- Vol. 2 (1) , 6-11
- https://doi.org/10.1016/0167-577x(83)90021-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The X-ray topography station at Daresbury laboratoryNuclear Instruments and Methods in Physics Research, 1982
- Projective properties of Laue topographsJournal of Applied Crystallography, 1980
- Synchrotron radiation – its application to high-speed, high-resolution X-ray diffraction topographyJournal of Applied Crystallography, 1975
- APPLICATION OF X-RAY TOPOGRAPHY TO THE ANALYSIS OF THE DISLOCATION ARRANGEMENT IN DEFORMED COPPER SINGLE CRYSTALSCanadian Journal of Physics, 1967