Trajectory focusing in surface scattering and the analysis of surface structure
- 1 January 1978
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 37 (1) , 105-112
- https://doi.org/10.1080/00337577808242093
Abstract
An approximate analytical theory of the focusing of trajectories of channelled ions in the transverse plane is developed, following ideas found by computer simulation. Its use in interpreting experiments on the scattering of MeV ions from crystal surfaces at grazing incidence is demonstrated. Criteria for strong reflection and the angular width of reflection peaks are deduced. It is shown how surface structure analysis techniques might be developed, taking the case of oxygen in a tungsten {110} surface as an example.Keywords
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