Point defect characterization of GaN and ZnO
- 1 December 1999
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 66 (1-3) , 30-32
- https://doi.org/10.1016/s0921-5107(99)00115-4
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Electrical properties of bulk ZnOSolid State Communications, 1998
- High Al-content AlGaN/GaN MODFETs for ultrahigh performanceIEEE Electron Device Letters, 1998
- Electron-irradiation-induced deep level in n-type GaNApplied Physics Letters, 1998
- InGaN/GaN/AlGaN-based laser diodes with modulation-doped strained-layer superlattices grown on an epitaxially laterally overgrown GaN substrateApplied Physics Letters, 1998
- High power applications for GaN-based devicesSolid-State Electronics, 1997
- Defect Donor and Acceptor in GaNPhysical Review Letters, 1997
- Degenerate layer at GaN/sapphire interface: Influence on Hall-effect measurementsApplied Physics Letters, 1997
- Optical detection of magnetic resonance in electron-irradiated GaNPhysical Review B, 1997
- Similarities in the bandedge and deep-centre photoluminescence mechanisms of ZnO and GaNSolid State Communications, 1997
- The Role of Impurities in Hydride Vapor Phase Epitaxially Grown Gallium NitrideMRS Proceedings, 1995