Quantitative Microprobe Analysis of Thin Insulating Films
- 1 January 1968
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Quantitative Microprobe Analysis by Means of Target Current MeasurementsPublished by Springer Nature ,1967
- Atomic Fluorescence YieldsReviews of Modern Physics, 1966
- Characteristic fluorescence corrections in electron-probe microanalysisBritish Journal of Applied Physics, 1965
- Multiple scattering of 5-30 keV electrons in evaporated metal films II: Range-energy relationsBritish Journal of Applied Physics, 1964
- The present state of quantitative X-ray microanalysis Part 1: Physical basisBritish Journal of Applied Physics, 1963
- A Method for Calculating the Absorption Correction in Electron-Probe MicroanalysisPublished by Elsevier ,1963
- The Efficiency of Production of Characteristic X-radiation in Thick Targets of a Pure ElementProceedings of the Physical Society, 1961
- Electron Probe MicroanalysisPublished by Elsevier ,1960
- Le rendement de fluorescenceJournal de Physique et le Radium, 1955
- Zur Theorie des Durchgangs schneller Korpuskularstrahlen durch MaterieAnnalen der Physik, 1930