Minimization of the overestimation of thin foil thickness in the contamination spot separation method
- 31 March 1986
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 20 (3) , 381-384
- https://doi.org/10.1016/0036-9748(86)90162-6
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Contamination formed around a very narrow electron beamUltramicroscopy, 1976
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975