Gallium nitride: Method of defect characterization by wet oxidation in an oxalic acid electrolytic cell
- 1 July 2002
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 20 (4) , 1339-1341
- https://doi.org/10.1116/1.1488644
Abstract
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