Mathematical formulation for the photo-induced open circuit voltage decay method for measurement of minority carrier lifetime in solar cells

1 February 1981

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters

Vol. 2 (2) , 53-55
https://doi.org/10.1109/edl.1981.25337

Abstract

A mathematical formulation is presented for the measurement of minority carrier lifetime in solar cells by the photo-induced open circuit voltage decay method. It is shown that the method can be improved by using long wavelength light pulses of small duration.

Keywords

CIRCUITS
VOLTAGE
CHARGE CARRIER LIFETIME
PHOTOVOLTAIC CELLS
INTEGRAL EQUATIONS
PULSE SHAPING METHODS
WAVELENGTH MEASUREMENT
PULSE MEASUREMENTS
SPACE CHARGE
ABSORPTION

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