Multielement Mapping of α-SiC by Scanning Auger Microscopy
- 1 October 1987
- journal article
- Published by Wiley in Advanced Ceramic Materials
- Vol. 2 (4) , 773-779
- https://doi.org/10.1111/j.1551-2916.1987.tb00145.x
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Scanning Auger microscopy of corroded SiCJournal of Materials Science Letters, 1986
- Hot Corrosion of Sintered α‐Sic at 1000°CJournal of the American Ceramic Society, 1985
- Auger Analysis of Hot‐Pressed and Sintered Silicon CarbideJournal of the American Ceramic Society, 1985
- Ratioed scatter diagrams. An erotetic method for phase identification on complex surfaces using scanning Auger microscopyJournal of Vacuum Science & Technology A, 1984
- Microanalytical investigation of sintered SiCJournal of Materials Science, 1983
- Techniques for the correction of topographical effects in scanning Auger electron microscopyJournal of Applied Physics, 1983