Beam‐induced loss of organic mass under electron‐microprobe conditions
- 1 March 1974
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 100 (2) , 177-188
- https://doi.org/10.1111/j.1365-2818.1974.tb03927.x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The use of thin specimens for X-ray microanalysis in biologyJournal of Microscopy, 1973
- Specimen damage caused by the beam of the transmission electron microscope, a correlative reconsiderationJournal of Ultrastructure Research, 1970
- The Efficiency of Production of Characteristic X-radiation in Thick Targets of a Pure ElementProceedings of the Physical Society, 1961