Etude par microscopie electronique a balayage de l'endommagement par fatigue du cuivre apres implantation de divers elements (de He à Xe)
- 15 May 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 209-210, 989-994
- https://doi.org/10.1016/0167-5087(83)90910-9
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Modifications in fatigue surface damage by ion implantation in polycrystalline copperScripta Metallurgica, 1982
- Ion implantation damage produced by 100 keV Ar+ ions in Fe 40 at.% Al and FeCo2V ordered alloysNuclear Instruments and Methods, 1981
- Modification of the fatigue behavior of copper and stainless steel by ion implantationNuclear Instruments and Methods, 1981
- Etude comparee de l'endommagement par fatigue sous vide et sous air du cuivre polycristallinScripta Metallurgica, 1980