HREM structure characterization of interfaces in semiconducting multi‐layers using molecular‐dynamics‐supported image interpretation
- 2 August 1995
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 179 (2) , 214-228
- https://doi.org/10.1111/j.1365-2818.1995.tb03634.x
Abstract
No abstract availableKeywords
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