Ellipsometry on magnetooptic thin film multilayer systems
- 1 July 1984
- journal article
- research article
- Published by Springer Nature in Applied Physics B Laser and Optics
- Vol. 34 (3) , 139-143
- https://doi.org/10.1007/bf00697506
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Measuring the Magnetooptic Kerr effect by diffractionApplied Physics A, 1983
- Magnetooptical studies on thin iron filmsApplied Physics A, 1982
- Measurements of the longitudinal magnetooptic kerr reflection of a simple multilayer structureIEEE Transactions on Magnetics, 1969
- Longitudinal Kerr Magneto-optic Effect in Multilayer Structures of Dielectric and Magnetic FilmsOptica Acta: International Journal of Optics, 1968
- Magneto-optical Scattering from Multi-layer Magnetic and Dielectric FilmsOptica Acta: International Journal of Optics, 1965