Secondary electron emission as a technique for in situ crystal alignment in low ion-energy reflection experiments
- 1 December 1973
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 6 (12) , 1174-1175
- https://doi.org/10.1088/0022-3735/6/12/005
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Instrumentation for the study of ion reflection and secondary ion emission upon ion bombardment of atomically clean and smooth monocrystalline metal surfacesJournal of Physics E: Scientific Instruments, 1971