Noise Characterization of Linear Twoports in Terms of Invariant Parameters
- 1 June 1967
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 2 (2) , 37-40
- https://doi.org/10.1109/jssc.1967.1049782
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- IRE Standards on Methods of Measuring Noise in Linear Twoports, 1959Proceedings of the IRE, 1960