A 90-GHz double-drift IMPATT diode made with Si MBE

1 May 1987

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 34 (5) , 1084-1089
https://doi.org/10.1109/t-ed.1987.23049

Abstract

For the first time silicon double-drift IMPATT structures have been grown completely by Si molecular-beam epitaxy. The n-type layers are grown at 750 °C on low-resistivity n⁺-type substrates followed by p-type layers at 650 °C. The highly doped p⁺-layers are grown by solid-phase epitaxy in the MBE system. Device design is made for CW operation in W-band. The material is investigated by inspection of beveled samples, defect etching, TEM, SIMS, and spreading resistance measurements. Double-drift flat-profile diodes are housed and mounted employing a technological procedure approved for single-drift diodes. For initial device characterization, dc measurements are performed. Information about doping profile, series, and thermal resistances is obtained. Preliminary RF measurements delivered a maximum output power of 600 mW at 94 GHz with 6.7-percent efficiency from an unoptimized structure.

Keywords

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