X-Ray Spectrometer Attachment for Elmiskop I Electron Microscope

1 May 1966

journal article
research article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 37 (5) , 623-626
https://doi.org/10.1063/1.1720267

Abstract

With the aid of an x‐ray spectrometer attachment for the electron microscope (Elmiskop I), it is possible to perform quantitative analyses of the chemical elements in a specimen. The spectrometer attachment is based on the semifocusing method. It is equipped with six analyzing crystals and two counters which may be exchanged during operation. It is possible to analyze for all elements with an atomic number greater than 11. The minimum mass detectable is 10⁻¹⁴ g.

Keywords

This publication has 2 references indexed in Scilit:

Röntgenmikroanalyse elektronenmikroskopischer Präparate
Chemie Ingenieur Technik - CIT, 1965
Die Erzeugung lichtstarker Röntgenspektren mit Hilfe von Konkavkristallen
The European Physical Journal A, 1931