Optical techniques for composition measurement of bulk and thin-film Cd1−yZnyTe
- 1 May 1991
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (3) , 1897-1901
- https://doi.org/10.1116/1.585378
Abstract
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