In situ RHEED observation of selective diminution at Si(001)-2 × 1 superlattice spots during MBE
- 3 August 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 174 (1-3) , 658-665
- https://doi.org/10.1016/0039-6028(86)90488-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Advanced Techniques to Decrease Defect Density in Molecular Beam Epitaxial Silicon FilmsJapanese Journal of Applied Physics, 1985
- Silicon molecular beam epitaxyThin Solid Films, 1983
- Reflection Electron Microscope Observations of Dislocations and Surface Structure Phase Transition on Clean (111) Silicon SurfacesJapanese Journal of Applied Physics, 1980
- Low-Energy Electron Diffraction Study of Silicon Surface StructuresThe Journal of Chemical Physics, 1962