Combining convergent-beam diffraction with high resolution imaging
- 31 December 1981
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 6 (1) , 101-108
- https://doi.org/10.1016/s0304-3991(81)80187-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Symmetry determination of the room-temperature form of LnNbO4(Ln = La,Nd) by convergent-beam electron diffractionActa Crystallographica Section A, 1980
- New layered structure of Bi2W2O9determined by 1 MV high-resolution electron microscopyActa Crystallographica Section A, 1979
- Subsolidus phase relations in the BaTiO3TiO2 systemJournal of Solid State Chemistry, 1974