Cutting off the diffraction: A numerical solution in scanning near-field optical microscopy
- 18 November 1996
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 69 (21) , 3125-3127
- https://doi.org/10.1063/1.116803
Abstract
In scanning near-field optical microscopy, the derived image is often obscured by diffraction effects. To reduce these, we subtract two images taken at different probe heights above the surface and obtain an enhanced image with the diffraction effects largely removed. We present the modelling and explore its foundation.Keywords
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