Oxygen distribution in sputtered Nb-Ge films
- 15 February 1976
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 28 (4) , 237-239
- https://doi.org/10.1063/1.88711
Abstract
A quantiative determination of the distribution of oxygen in a high‐Tc (22 K) Nb‐Ge film has been made using a nuclear backscattering method. The Nb/Ge ratios as a function of depth have also been determined. An apparent correlation between oxygen concentration and Nb/Ge ratio is observed.Keywords
This publication has 4 references indexed in Scilit:
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- Preparation and analysis of superconducting Nb-Ge filmsPhysical Review B, 1975
- Comparison of surface layer analysis techniquesThin Solid Films, 1973
- Superconductivity in Nb–Ge films above 22 KApplied Physics Letters, 1973