Redundancy for LSI Yield Enhancement
- 1 December 1967
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 2 (4) , 172-182
- https://doi.org/10.1109/jssc.1967.1049815
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Technological foundations and future directions of large-scale integrated electronicsPublished by Association for Computing Machinery (ACM) ,1966
- Cost-size optima of monolithic integrated circuitsProceedings of the IEEE, 1964
- A Catalog of Three-Variable Or-Invert and And-Invert Logical CircuitsIEEE Transactions on Electronic Computers, 1963