Effect of electron lenses on beam noise
- 1 April 1958
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Electron Devices
- Vol. 5 (2) , 84-88
- https://doi.org/10.1109/T-ED.1958.14337
Abstract
Some types or electron guns used to form the beam of a low-noise beam type microwave amplifier (e.g. traveling-wave tube) impress sharp potential discontinuities or velocity jumps on this beam. These discontinuities produce strong electrostatic lenses. This paper presents a theory supported by experimental results, showing that the effect of such lenses is to increase the beam noise. Further, axial magnetic fields are shown to reduce this undesirable effect.Keywords
This publication has 2 references indexed in Scilit:
- Low-Noise Traveling-Wave Tubes for X-BandProceedings of the IRE, 1953
- Traveling-Wave Tube Noise FigureProceedings of the IRE, 1952