A microwave method for thermal expansion measurement
- 1 December 1983
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 16 (12) , 1200-1202
- https://doi.org/10.1088/0022-3735/16/12/020
Abstract
A method is described for measuring total expansion of a bulk sample of conducting material, using a microwave resonance technique. The method has been used to measure thermal expansion of niobium and of a sample of beryllium-copper in the range 4K to 300K.Keywords
This publication has 3 references indexed in Scilit:
- Dimensional measurement by microwave resonancesJournal of Physics E: Scientific Instruments, 1981
- A proposed high-precision measurement of the electron Compton wavelength (h/mec) using cryogenic metrological techniquesJournal of Physics B: Atomic and Molecular Physics, 1978
- Thermal expansion of vanadium, niobium, and tantalum at low temperaturesCryogenics, 1962