Electron probe microanalysis applied to very thin layers of aluminium-nickel alloys
- 1 July 1978
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 7 (3) , 152-155
- https://doi.org/10.1002/xrs.1300070308
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Vapor-quenched AlNi alloy thin films in concentration range 12.5 to 75.4 at .% NiScripta Metallurgica, 1975
- X-ray spectrometry of Al + Ni powder compacts and alloy thin filmsX-Ray Spectrometry, 1974
- Aluminium-rich AlNi alloys rapidly quenched from the vaporScripta Metallurgica, 1973
- The present state of quantitative X-ray microanalysis Part 2: Computational methodsBritish Journal of Applied Physics, 1963