STEM imaging of thick specimens with off-axis detectors
- 1 January 1984
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 1 (1) , 83-94
- https://doi.org/10.1002/jemt.1060010108
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Scanning transmission electron microscopy of thin specimensUltramicroscopy, 1976
- Topographical contrast in the transmission electron microscopeUltramicroscopy, 1975