Scanning tunneling microscopy at low temperatures on the c(4×2)/(2×1) phase transition of Si(100)
- 1 May 1994
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 12 (3) , 2015-2017
- https://doi.org/10.1116/1.587692
Abstract
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