Analysis of inhomogeneous thin films by spectrophotometric measurements
- 1 April 1989
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 171 (2) , 243-250
- https://doi.org/10.1016/0040-6090(89)90631-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Automatic determination of the optical constants of inhomogeneous thin filmsApplied Optics, 1982
- Exact computation of the reflectance of a surface layer of arbitrary refractive-index profile and an approximate solution of the inverse problemJournal of the Optical Society of America, 1982