A Thomas-Fermi description of the screening around the vacancy in silicon : Charge state dependence
- 31 January 1980
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 33 (3) , 293-297
- https://doi.org/10.1016/0038-1098(80)91156-4
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- Wave-Number-Dependent Dielectric Function of SemiconductorsPhysical Review B, 1962