Carrier density fluctuation noise in field-effect transistors

• 1 January 1963
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 51  (11) , 1670-1671
• https://doi.org/10.1109/PROC.1963.2659

Abstract

Keywords

• CHARGE CARRIER DENSITY
• FLUCTUATIONS
• FETS
• MAXIMUM LIKELIHOOD ESTIMATION
• TEMPERATURE
• CIRCUIT NOISE
• WRITING
• RANDOM VARIABLES
• MONTE CARLO METHODS
• ESTIMATION ERROR