Secondary ion mass spectroscopy studies of glass thin films prepared with sol/gel techniques
- 31 December 1981
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 9 (1) , 345-358
- https://doi.org/10.1016/0378-5963(81)90047-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Characterization of heliostat corrosionSolar Energy Materials, 1980
- Primary-ion charge compensation in SIMS analysis of insulatorsJournal of Applied Physics, 1979
- Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurementsJournal of Applied Physics, 1976
- II. The energy spectrum of ejected atoms during the high energy sputtering of goldPhilosophical Magazine, 1968