Plasmon surface polariton fields for the characterization of thin films
- 1 May 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 159 (1-2) , 323-330
- https://doi.org/10.1016/0040-6090(88)90644-x
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Total internal diffraction of plasmon surface polaritonsApplied Physics Letters, 1987
- Plasmon surface polariton fields versus TIR evanescent waves for scattering experiments at surfacesOptics Communications, 1987
- Brownian dynamics close to a wall studied by photon correlation spectroscopy from an evanescent wavePhysical Review Letters, 1986
- Preparation and Characterization of Asymmetric Soap Films on Vertical Si/SiO 2 -InterfacesEurophysics Letters, 1986
- Surface plasmon enhanced Raman spectra of monolayer assembliesThe Journal of Chemical Physics, 1982
- Study of Multilamellar Films of Photoreceptor Membrane by Photon-Correlation Spectroscopy Combined with Integrated OpticsPhysical Review Letters, 1982
- Vibrational spectra in the CH stretching region and the structure of the polymethylene chainSpectrochimica Acta Part A: Molecular Spectroscopy, 1978
- On the quantitative interpretation of biomembrane structure by Raman spectroscopyBiochimica et Biophysica Acta (BBA) - Biomembranes, 1977