Depth profiling measurement of atomic carbon dissolved in oxides and silicates
- 1 June 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 197 (1) , 27-36
- https://doi.org/10.1016/0167-5087(82)90113-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Carbon content of magnesium oxide single crystals grown by the arc fusion methodJournal of Crystal Growth, 1977
- A high-sensitivity laser microprobe mass analyzerApplied Physics A, 1975
- ARC-fusion growth and characterization of high-purity MgO crystalsJournal of Crystal Growth, 1971