On the influence of surface-roughness on X-ray photoelectron intensities
- 31 December 1973
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 2 (3) , 277-287
- https://doi.org/10.1016/0368-2048(73)80020-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Analogies between quantitative X‐ray fluorescence analysis (XRFA) and quantitative X‐ray photoelectron spectrometry (XPS)X-Ray Spectrometry, 1973
- Quantitative measurements on gold-silver alloys by x-ray photoelectron spectroscopyAnalytical Chemistry, 1972
- Ultrasoft-X-Ray Reflection, Refraction, and Production of Photoelectrons (100-1000-eV Region)Physical Review A, 1972
- Zur Ermittlung der Teilchengröße dichtgeschütteter pulverförmiger Proben durch RöntgenfluoreszenzanalyseArchiv für das Eisenhüttenwesen, 1968