Calculated electron and hold spatial ionization profiles in bulk GaAs and superlattice avalanche photodiodes
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 24 (10) , 2001-2006
- https://doi.org/10.1109/3.8535
Abstract
No abstract availableThis publication has 29 references indexed in Scilit:
- Physics of the enhancement of impact ionization in multiquantum well structuresApplied Physics Letters, 1987
- The p-n heterojunction quantum well APD: A new high-gain low-noise high speed photodetector suitable for lightwave communications and digital applicationsIEEE Transactions on Electron Devices, 1987
- The p-n junction quantum well APD: A new solid-state photodetector for lightwave communications systems and on-chip detector applicationsIEEE Transactions on Electron Devices, 1987
- Theory of the doped quantum well superlattice APD: A new solid-state photomultiplierIEEE Journal of Quantum Electronics, 1986
- Electron and hole impact ionization rates in InP/Ga0.47In0.53As superlatticeIEEE Journal of Quantum Electronics, 1986
- Electron and hole impact ionization coefficients in GaAs-AlxGa1−xAs superlatticesApplied Physics Letters, 1985
- Theory of electron impact ionization including a potential step: Application to GaAs-AlGaAsIEEE Electron Device Letters, 1985
- Monte Carlo investigation of transient hole transport in GaAsJournal of Applied Physics, 1984
- Single-carrier-type dominated impact ionisation in multilayer structuresElectronics Letters, 1982
- Enhancement of electron impact ionization in a superlattice: A new avalanche photodiode with a large ionization rate ratioApplied Physics Letters, 1982