Picosecond electrical sampling using a scanning force microscope
- 3 December 1992
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 28 (25) , 2302-2303
- https://doi.org/10.1049/el:19921481
Abstract
A scanning force microscope probe for measuring ultrafast voltage signals is demonstrated. The new technique is based on mixing due to the square-law force interaction present between the microscope tip and sample. Correlation of 100 ps pulses and mixing up to 20 GHz have been achieved.Keywords
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