Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers
- 24 July 1995
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 67 (4) , 476-478
- https://doi.org/10.1063/1.114541
Abstract
The atomic force microscope is used to measure dielectric polarization forces on surfaces induced by a charged tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using polarization forces we have been able to image liquid films, droplets, and other weakly adsorbed material.Keywords
This publication has 0 references indexed in Scilit: