Investigations of aluminum films with synchrotron radiation of wavelengths 500 to 1000 Å

• 1 August 1968
• journal article
• research article
• Published by Springer Nature in The European Physical Journal A
• Vol. 211  (4) , 329-341
• https://doi.org/10.1007/bf01379955

Abstract

Keywords

• STRUCTURE
• WAVELENGTH
• THICKNESSES
• TRANSMITTANCE AND REFLECTANCE
• REFLECTANCE OF AL
• AL FILMS