Transparency Factor for Weakly Absorbing Samples in X-Ray Diffractometry
- 1 January 1958
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 29 (1) , 64-65
- https://doi.org/10.1063/1.1722945
Abstract
Equations have been developed for the transparency factor applicable to the intensity of x‐rays scattered from very weakly absorbing materials in the standard diffractometric technique. The expressions differ from the standard absorption correction because of the variation of effective scattering volume with angle. Both equations and illustrative curves are presented.This publication has 6 references indexed in Scilit:
- Neutron Diffraction Studies of a Nickel Zinc FerritePhysical Review B, 1954
- The Effect of a Low Absorption Coefficient on X-Ray Spectrometer MeasurementsReview of Scientific Instruments, 1952
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950
- Geometrical Factors Affecting the Contours of X-Ray Spectrometer Maxima. II. Factors Causing BroadeningJournal of Applied Physics, 1950
- LXXII. On the optimum thickness of powder specimens in X-ray diffraction workJournal of Computers in Education, 1944
- The Diffraction of X-Rays by Liquid ElementsReviews of Modern Physics, 1943