Element Specific Magnetization of Buried Interfaces Probed by Diffuse X-Ray Resonant Magnetic Scattering
- 28 October 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 77 (18) , 3925-3928
- https://doi.org/10.1103/physrevlett.77.3925
Abstract
The magnetization of buried interfaces and its relationship to interfacial roughness is probed for Co films and Co/Cu multilayers using diffuse x-ray resonant magnetic scattering, a method in which the average diffusely scattered x-ray intensity is compared with the component that reflects magnetic scattering. The comparison demonstrates that the boundary between magnetic and nonmagnetic layers is smoother than the interfacial roughness, with short-wavelength roughness less effective in magnetic scattering than longer-wavelength roughness.Keywords
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