Third-harmonic generation measurement of nonlinearities in SiO2-TiO2 sol-gel films
- 18 March 1991
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 58 (11) , 1128-1130
- https://doi.org/10.1063/1.104392
Abstract
Third‐harmonic generation has been used to measure the magnitude and phase of the nonlinear susceptibility χ(3)(3ω) of SiO2‐TiO2 sol‐gel thin films as a function of TiO2 concentration. Nonlinearities 20 times larger than those of fused silica were found, making such films useful for nonlinear optics in glass waveguides.Keywords
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