Surface characterization of polymers: Complementary information from x-ray photoelectron spectroscopy and static secondary ion mass spectrometry

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Abstract
Polymers have found a wide variety of applications ranging from biocompatible materials to use as insulators in microelectronic devices. For many applications the surface of the polymer plays an important role such as when surface modification of the polymer is required or has occurred during processing. Surface characterization of polymers may be accomplished by many methods such as analysis by x‐ray photoelectron spectroscopy,(XPS), and static secondary ion mass spectrometry, (SSIMS). The information of each of these techniques is unique and together provide a complete picture of a polymer surface in terms of local chemistry and of long‐range chemistry of the material. The application of XPS and SSIMS to several polymer systems will be discussed and the information of the analytical methods will be compared and contrasted.

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