Effect of Radiation Damage on the Response of Semiconductor Detectors to Fission Fragments
- 1 July 1964
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 35 (7) , 842-846
- https://doi.org/10.1063/1.1746812
Abstract
Measurements have been made of the pulse‐height defect as a function of integrated fission‐fragment and alpha‐particle fluxes for a gold surface barrier and a p‐n junction detector. The measurements show that the pulse‐height defects increase as the detectors are damaged by radiation and that incident fission fragments are more effective in producing radiation damage than are alpha particles. It was found that, as the detectors were damaged, the pulse‐height defect increased more rapidly for the high energy fission‐fragment group from 252Cf than it did for the low energy group. It was also found that the rate of increase of the defect decreased as the electric field in the detector was increased.Keywords
This publication has 9 references indexed in Scilit:
- Coincident Time-of-Flight Measurements of the Velocities ofFission FragmentsPhysical Review B, 1963
- Response of Semiconductor Detectors to Fission FragmentsReview of Scientific Instruments, 1963
- Multiplication Phenomenon for Fission Fragment Response in Semiconductor DetectorsReview of Scientific Instruments, 1963
- Response of Semiconductor Detectors to Fission FragmentsReview of Scientific Instruments, 1963
- Radiation Damage by Charged Particles in Silicon Junction DetectorsIEEE Transactions on Nuclear Science, 1963
- Semiconductor Particle DetectorsAnnual Review of Nuclear Science, 1962
- Calibration of solid state P-N detectors with alpha and heavy high-energy particlesNuclear Instruments and Methods, 1962
- Multichannel Analyzer Data Analysis by a Least Squares Computer ProgramReview of Scientific Instruments, 1962
- Introduction to Semiconductor Particle DetectorsIRE Transactions on Nuclear Science, 1961