OBSERVATIONS OF {111} ATOMIC PLANES IN SILICON
- 15 July 1968
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 13 (2) , 67-68
- https://doi.org/10.1063/1.1652510
Abstract
Using a Philips EM300 electron microscope and chemically thinned slices cut from a single crystal of silicon, the {111} atomic planes of 3.138‐Å spacing have been imaged. A two‐beam tilted illumination technique was employed.Keywords
This publication has 4 references indexed in Scilit:
- ELECTRON MICROSCOPE OBSERVATION OF ATOMIC PLANES AND ATOMIC POSITIONS IN GERMANIUMCanadian Journal of Physics, 1966
- Observations of Lattice Images of Light Element Crystals by Means of an Electron MicroscopeJapanese Journal of Applied Physics, 1966
- Dynamical theory of electron diffraction for the electron microscopic image of crystal lattices I. Images of single crystalsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1961
- The electron microscopy of crystal latticesAdvances in Physics, 1958