Scanning electron microscope studies of AlGaN films grown by organometallic vapor phase epitaxy
- 1 April 1998
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 42 (4) , 637-646
- https://doi.org/10.1016/s0038-1101(97)00278-5
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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